O 56: Scanning probe techniques: Method development II
Mittwoch, 11. März 2026, 10:30–12:15, HSZ/0401
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10:30 |
O 56.1 |
Simulation of coupled AFM and constant current STM images — •Marvin Krenz, Miguel Wiche, Daniel Ebeling, and Simone Sanna
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10:45 |
O 56.2 |
High spatial resolution of Si(111)-7x7 using LFM with a CO-tip — •Shinjae Nam, Thomas Holzmann, Franz Giessibl, and Alfred Weymouth
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11:00 |
O 56.3 |
Spatially Resolved Mode Analysis of Ultra-Long qPlus Probes for STM/AFM — •Aleksander Bogucki, Yeon-Ji Kim, Yewon Kim, Sarah Yi, German Orlov, Lei Fang, Wonjun Jang, and Andreas Heinrich
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11:15 |
O 56.4 |
Comparative Analysis of SPM-Based Work Function Measurement Techniques with Application to Work Function Engineering of Superconducting Nb(110) — •Daryoush Nosraty Alamdary, Matthias Bode, and Artem Odobesko
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11:30 |
O 56.5 |
Towards Atomically Precise Fabrication through STM with Flat, Crystalline Probes — •Marc Savoie, Eduardo Barrera Ramirez, Bheeshmon Thanabalasingam, and Marco Taucer
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11:45 |
O 56.6 |
Atomically Precise Si Abstraction by Inverted-Mode STM — •Rosemary Cranston, Zehra Ahmed, Eduardo Barrera, Brandon Blue, Adam Bottomley, Christian Imperiale, Alex Inayeh, Mathieu Morin, Marco Taucer, and Bheeshmon Thanabalasingam
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12:00 |
O 56.7 |
Graphene Coated Nanoprobes for Local Conductivity Measurements — •Maria Saavedra-Fredes, Valeria del Campo, and Tomas P. Corrales
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