Erlangen 2026 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 81: Search for Dark Matter III

T 81.5: Vortrag

Donnerstag, 19. März 2026, 17:15–17:30, AM 00.014

Results of a multi-wafer, double TES detector in the CRESST Experiment — •Felix Dominsky for the CRESST collaboration — Max-Planck-Institut für Physik, Garching, Germany

CRESST (Cryogenic Rare Event Search with Superconducting Thermometers) is a leading direct-detection experiment for dark matter that implements Transition Edge Sensors (TESs) to measure minute energy depositions in cryogenic target crystals. As several other experiments in this field, CRESST observes an unexpected excess of events close to the detection threshold up to 200eV, commonly referred to as the low-energy excess (LEE). The current detector generation of CRESST employs two TES per crystal to better characterize this excess and investigate possible origins. Following this approach, CRESST has additionally deployed a stacked module, consisting of four vertically stacked, thin silicon on sapphire (SoS) wafer double-TES detectors. Their reduced target mass results in enhanced energy resolution, while the vertical arrangement allows the outer wafers to act as an active veto for the inner ones. This contribution will present the concept and motivation of this stacked-detector module and discuss first preliminary results and insights from its operation.

Keywords: CRESST; Dark Matter; Rare event search