Dresden 2003 – wissenschaftliches Programm

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DS: Dünne Schichten

DS 1: FV-internes Symposium „Dünnschichtanalytik“ I

DS 1.1: Hauptvortrag

Montag, 24. März 2003, 09:30–10:10, GER/37

Stress, strain and magnetic anisotropy: all is different in nanometer thin films — •Dirk Sander — Max-Planck-Institut für Mikrostrukurphysik, Weinberg 2, D-06120 Halle

The long history of stress measurements in thin films is briefly reviewed. The venerable bending-beam technique which is the basis of such measurements is introduced and its quantitative analysis based on recent finite element calculations is discussed. The correlation between atomic structure and film stress can be investigated with sub-monolayer sensitivity. Examples are presented where stress measurements identify subtle structural changes of the film structure or morphology. The in-situ combination of stress and surface X-ray diffraction measurements is used to investigate stress-strain relations at surfaces and in monolayers. These examples point at the limits of simple stress-strain relations, and they identify surface stress, structural relaxation and surface alloy formation as important contributions to the measured stress. The implications of even small strain and stress in nm thick films on the magnetic anisotropy is elucidated, and the strain induced modification of the magnetoelastic coupling is discussed in view of recent theoretical work.