Parts | Days | Selection | Search | Downloads | Help
DS: Dünne Schichten
DS 1: FV-internes Symposium „Dünnschichtanalytik“ I
Monday, March 24, 2003, 09:30–12:50, GER/37
 |
09:30 | DS 1.1 | Invited Talk: Stress, strain and magnetic anisotropy: all is different in nanometer thin films — •Dirk Sander |
|
10:10 | DS 1.2 | Invited Talk: Scanning probe methods for thin film analysis — •Mathias Getzlaff |
|
10:50 | DS 1.3 | Invited Talk: Orts- und zeitaufgelöste Analytik dünnster Schichtsysteme — •Christian Ziethen |
|
11:30 | DS 1.4 | Invited Talk: Depth microscopy on ultra thin layers using energetic ion beams — •Günther Dollinger |
|
12:10 | DS 1.5 | Invited Talk: A Sharp Eye on Thin Films - Advances Through Synchrotron Radiation — •Ralf Röhlsberger |