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HL: Halbleiterphysik

HL 10: Halbleiterlaser II

HL 10.1: Talk

Monday, March 24, 2003, 15:15–15:30, BEY/81

Structural parameters for semiconductor heterostructures through comparison of computed and measured photoluminescence spectra — •Christoph Schlichenmaier¹, Jörg Hader², Jerry V. Molony², Walter Hoyer¹, Mackillo Kira¹, and Stephan W. Koch¹ — ¹Philipps-Universität und Wissenschaftliches Zentrum für Materialwissenschaften Marburg — ²Arizona Center for Mathematical Sciences and Optical Sciences Center, University of Arizona, Tucson, AZ 85721

During the production process of optical semiconductor devices, it is functional to predict quantitatively the behavior of the final structure. Photoluminescence spectra can be measured routinely. But then sophisticated theoretical calculations are needed to evaluate the spectra for the structural parameters. We present results from first principle calculations based on Semiconductor Bloch[1] and Semiconductor Luminescence[2] equations.

[1] A. Girndt, S.W. Koch, and W.W. Chow, Appl. Phys. A 66, 1 (1998).

[2] M. Kira, F. Jahnke, W. Hoyer, and S.W. Koch, Prog. Quantum Electron. 23, 189 (1999).