O 28: Methodisches (Exp. und Theorie)
Samstag, 5. März 2005, 15:00–17:00, TU EB407
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15:00 |
O 28.1 |
Coherent x-ray reflectivity using white synchrotron radiation — •Tobias Panzner, Ivan Vartanyants, Gudrun Gleber, and Ullrich Pietsch
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15:15 |
O 28.2 |
Calculations for a matched photon and photoelectron energy dispersive soft x-ray beamline — •D.R. Batchelor, Th. Schmidt, R. Follath, C. Jung, R. Fink, and E. Umbach
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15:30 |
O 28.3 |
Resonant inelastic soft x-ray scattering probing semiconductor surface adsorbate dynamics — •Franz Hennies, Alexander Föhlisch, Annette Pietzsch, Mitusuru Nagasono, Nadine Wittkowski, Stina Matsson, Maria-Novella Piancastelli, and Wilfried Wurth
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15:45 |
O 28.4 |
Two-Photon Photoemission Microscopy of Self-organized Ag-Nanostructures on Si(001) — •L. I. Chelaru, O. Heinz, P. Zhou, M. Horn-von Hoegen, D. von der Linde, and and F. Meyer zu Heringdorf
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16:00 |
O 28.5 |
GW quasiparticle energy calculations for surfaces: the influence of dynamic polarization in a repeated-slab approach — •Philipp Eggert, Christoph Freysoldt, Patrick Rinke, Arno Schindlmayr, and Matthias Scheffler
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16:15 |
O 28.6 |
The multipole compensation method for slab geometry — •Ferenc Tasnadi
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16:30 |
O 28.7 |
Genetic algorithms in surface cluster expansions — •Ole Wieckhorst und Stefan Müller
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16:45 |
O 28.8 |
The Nanoworkbench: A Tool to Probe Electronic Properties of Surfaces and Small Structures — •Hubertus Marbach, Olivier Guise, Jeremy Levy, Joachim Ahner und John T. Yates, Jr.
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