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Berlin 2008 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)

Dienstag, 26. Februar 2008, 18:30–19:30, Poster F

18:30 O 43.1 The Kondo-resonance in photoemission spectra on ordered Ce surface alloys — •Markus Klein, Christina Albers, Juarez Da Silva, Kevin Beach, Fakher Assaad, and Friedrich Reinert
18:30 O 43.2 Temperature Dependence of the Single Particle Spectral Function of the 2D Kondo Lattice Model using the Dynamical Cluster Approximation — •Lee Martin and Fakher Assaad
18:30 O 43.3 Evidence for quantum confinement in lognormal size distributed nanodiamonds — •Thomas Berg, Edit Marosits, Jochen Maul, Peter Nagel, Ulrich Ott, Florian Schertz, Stefan Schuppler, Christa Sudek, and Gerd Schönhense
18:30 O 43.4 Setup and Characterization of a Standing-Wave PEEM for EUVL mask inspection — •Jochen maul, Jingquan Lin, Andreas Oelsner, Dima Valdaitsev, Nils Weber, Matthias Escher, Michael Merkel, Ulf Kleineberg, and Gerd Schoenhense
18:30 O 43.5 Optical magnetic circular dichroism in two-photon photoemission — •Kerstin Hild, Jochen Maul, Gerd Schoenhense, and Hans-Joachim Elmers
18:30 O 43.6 Transmission photoemission electron microscopy for lateral mapping of the X-ray absorption structure of a metalloprotein in a liquid cell — •Daniel Panzer, Christian Beck, Jochen Maul, Marco Möller, Heinz Decker, and Gerd Schönhense
18:30 O 43.7 Time and energy resolved mulitphoton-photoemission microscopy of organic materials — •Florian Lindla, Gerhard Lilienkamp, and Winfried Daum
18:30 O 43.8 Characterization of W-Tips used in Tuning-Fork Non-Contact Atomic Force Microscopy by Field Ion Microscopy — •Daniel-Alexander Braun, Jens Falter, Thomas König, André Schirmeisen, Hendrik Hölscher, Udo D. Schwarz, and Harald Fuchs
18:30 O 43.9 Self-actuating self-sensing cantilever for dynamic AFM — •Henning von Allwörden, Alexander Schwarz, C. Julian Chen, and Roland Wiesendanger
18:30 O 43.10 Strategies for measuring interfacial friction by lateral manipulation of nanoparticles using atomic force microscopy techniques — •T. Mönninghoff, D. Dietzel, L. Jansen, H. Fuchs, U. D. Schwarz, and A. Schirmeisen
18:30 O 43.11 Design of an UHV-STM for applications at low temperatures and high magnetic fieldsDaniel Haude, •Matthias Menzel, Kirsten von Bergmann, Matthias Bode, and Roland Wiesendanger
18:30 O 43.12 Einfluss der elektronischen Struktur der Tunnelspitze auf spektroskopische Messungen — •Oliver Ferdinand, Kirsten von Bergmann, André Kubetzka, and Roland Wiesendanger
18:30 O 43.13 Spin-dependent Image Potential States Studied By SP-STS — •Anika Emmenegger, Stefan Krause, Gabriela Herzog, André Kubetzka, Daniel Haude, and Roland Wiesendanger
18:30 O 43.14 Signature of a nanoparticle in the evanescent heat transfer measured by NSThM — •Uli F. Wischnath, Joachim Welker, and Achim Kittel
18:30 O 43.15 Dynamic Force Microscopy: Fundamental mechanism of energy dissipation for organic molecules — •Markus Fendrich, Kai Ruschmeier, Christian Weiss, Manfred Lange, Tobias Kunstmann, André Schirmeisen, and Rolf Möller
18:30 O 43.16 Development of an UHV variable temperature STM — •Thomas Eelbo, Mike Gyamfi, Stefan Meckler, Oswald Pietzsch, and Roland Wiesendanger
18:30 O 43.17 A New Scanning Tunneling Microscope for Spin-Sensitive Measurements in Ultrahigh Vacuum, at Low Temperatures, and in High Magnetic Fields — •Mike Gyamfi, Stefan Meckler, Oswald Pietzsch, and Roland Wiesendanger
18:30 O 43.18 Interferometric detection methods for scanning near-field optical microscopy — •Christoph Zeh, Susanne C. Schneider, and Lukas M. Eng
18:30 O 43.19 Eddy current microscopy — •Marion Meier, Tino Roll, and Marika Schleberger
18:30 O 43.20 High-Resolution Combined Low-Temperature Scanning Tunneling/Atomic Force Microscope for 3D Force SpectroscopyBoris J. Albers, Todd Schwendemann, Mehmet Z. Baykara, Nicolas Pilet, •Marcus Liebmann, Markus Heyde, and Udo D. Schwarz
18:30 O 43.21 Energy dissipation of ballistic injected electrons and holes through individual molecules — •Alexander Bernhart, Mark Kaspers, Bastian Weyers, Evgeny Zubkov, Christian Bobisch, and Rolf Möller
18:30 O 43.22 surface velocity of shear quartzes for high speed friction measurements — •fengzhen zhang, othmar marti, stefan walheim, and thomas schimmel
18:30 O 43.23 Scanning tunneling microscopy measurements of graphene on an insulating substrate. — •Viktor Geringer, Sven Runte, Marcus Liebmann, Tim Echtermeyer, Reinhard Rückamp, Max Lemme, and Markus Morgenstern
18:30 O 43.24 A UHV-STM system for measurements at 300 mK and 14 T — •Stefan Becker, Marcus Liebmann, and Markus Morgenstern
18:30 O 43.25 Development of TERS System with Scanning Capability — •Seth White, Dietrich Wulferding, Alexander Doering, Hongdan Yan, Pushpendra Kumar, and Peter Lemmens
18:30 O 43.26 Use of a “needle-sensor” for non-contact scanning force microscopy and simultaneous measurement of the tunneling currentBert Voigtländer and •Irek Morawski
18:30 O 43.27 Construction of a Fibre-Tip SNOM for Investigation of Soft Organic Materials — •Philipp Lange, Omar Al-Khatib, Dörthe M. Eisele, Mario Dähne, Jürgen P. Rabe, and Stefan Kirstein
18:30 O 43.28 The nanoscale electrochemical potential of a current carrying surface state resolved with Scanning Tunneling Potentiometry — •Jan Homoth, Martin Wenderoth, Thomas Druga, Lars Winking, Rainer G. Ulbrich, Mark Kaspers, Alexander Bernhart, Bastian Weyers, Evgeny Zubkov, Rolf Möller, and Christian Bobisch
18:30 O 43.29 Analyzing and determination of the different shear force interactions — •Kai Braun, Catrinel Stanciu, Dai Zhang, and Alfred J. Meixner
18:30 O 43.30 Design of a vacuum system for the local study of molecules — •Matthias Prostak, Germar Hoffmann, and Roland Wiesendanger
18:30 O 43.31 Towards a quantitative determination of charge distribution and local potential by Phase-Electrostatic Force Microscopy: theory and applications — •Cristiano Albonetti, Paolo Annibale, and Fabio Biscarini
18:30 O 43.32 Design criteria for scanning tunneling microscopes to reduce the response to external disturbances — •Maximilian Assig, Alexandra Ast, Christian R. Ast, and Klaus Kern
18:30 O 43.33 The x-ray experimental endstation of beamline BL9 at DELTA — •Michael Paulus, Christian Sternemann, Christina Krywka, Andreas Schacht, and Metin Tolan
18:30 O 43.34 Positron annihilation induced Auger electron spectroscopy on Si single crystals — •Jakob Mayer, Klaus Schreckenbach, and Christoph Hugenschmidt
18:30 O 43.35 Order-N scaling of the Full-potential Linearized Augmented Plane Wave method — •Frank Freimuth, Daniel Wortmann, and Stefan Blügel
18:30 O 43.36 Topology-dependent life-time of surface states — •Koray Köksal and Jamal Berakdar
18:30 O 43.37 Multilayer-Optiken für die fs-Röntgendiffraktometrie — •Jörg Wiesmann und Carsten Michaelsen
18:30 O 43.38 An XUV- Split and Delay Line at the Free Electron Laser in Hamburg — •Torben Beeck, Mitsuru Nagasono, Holger Meyer, Sven Gieschen, Martin Beye, William F. Schlotter, Florian Sorgenfrei, Alexander Föhlisch, and Wilfried Wurth
18:30 O 43.39 Transient surface temperature of ultralthin Bi(111) heterolayers on Si(001) upon fs-laser excitation — •Anja Hanisch, Boris Krenzer, Simone Möllenbeck, Tobias Pelka, Paul Schneider, and Michael Horn-von Hoegen
18:30 O 43.40 Influence of Laser Heating on the X-ray Diffraction Intensity of InSb — •Jessica Walkenhorst, Eeuwe S. Zijlstra, and Martin E. Garcia
18:30 O 43.41 Time-, energy- and ANGLE-resolved photoelectron spectroscopy of surface dynamics using femtosecond XUV pulses — •Stefan Mathias, Luis Miaja-Avila, Margaret Murnane, Henry Kapteyn, Martin Aeschlimann, and Michael Bauer
18:30 O 43.42 first test of a beam splitter and delay line for the XUV at FLASH — •Rolf Mitzner, Björn Siemer, Marco Rutkowski, Sebastian Roling, Matthias Neeb, Tino Noll, Kai Tiedtke, Wolfgang Eberhardt, and Helmut Zacharias
18:30 O 43.43 A femtosecond X-ray/optical cross-correlator: Free-electron laser X-ray pulse induced transient optical reflectivity — •Cornelius Gahl, Armin Azima, Martin Beye, Martin Deppe, Kristian Döbrich, Urs Hasslinger, Franz Hennies, Alexej Melnikov, Mitsuru Nagasono, Annette Pietzsch, Martin Wolf, Wilfried Wurth, and Alexander Föhlisch
18:30 O 43.44 An angle-resolved time-of flight spectrometer for low-energy photoelectron spectroscopy — •Laurenz Rettig, Patrick S. Kirchmann, Uwe Bovensiepen, and Martin Wolf
18:30 O 43.45 Spectral Line Shape Variations in Time-Resolved Photoemission from a SolidE.E. Krasovskii, •Karsten Balzer, Sebastian Bauch, and Michael Bonitz
18:30 O 43.46 Spin-dependent electron lifetimes in 3d ferromagnet thin films — •Andreas Goris, Ilja Panzer, Martin Pickel, Anke B. Schmidt, Fabian Giesen, Jürgen Braun, Markus Donath, and Martin Weinelt
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