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DPG

Dresden 2009 – scientific programme

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DS: Fachverband Dünne Schichten

DS 2: Thin Film Characterisation: Structure Analyse and Composition (XRD, TEM, XPS, SIMS, RBS, ...) II

Monday, March 23, 2009, 14:00–15:30, GER 37

14:00 DS 2.1 Nickeldotierung von Diamantnanokristallen zur Erzeugung robuster Einzelphotonquellen — •Marco Wolfer, Armin Kriele, Oliver Williams, Harald Obloh, Crenguta-Columbina Leancu, Lutz Kirste und Christoph Nebel
14:15 DS 2.2 Texture analysis on the system Mn4Si7@Si(001): Combining statistical and microscopical information — •Herbert Schletter, Steffen Schulze, Michael Hietschold, Koen De Keyser, Christophe Detavernier, Gunter Beddies, and Meiken Falke
14:30 DS 2.3 Studies of interdiffusion and magnetism in magnetic multilayers — •Mathias Schmidt, János Major, Adrian Rühm, Márton Major, Max Nülle, and Helmut Dosch
14:45 DS 2.4 Non-destructive speciation of buried nanolayer systems by angle-corrected GIXRF-NEXAFS — •Beatrix Pollakowski and Burkhard Beckhoff
15:00 DS 2.5 Channeling irradiation of LiNbO3: Influence of ion energy and ion species — •Tobias Steinbach, Frank Schrempel, Thomas Gischkat, and Werner Wesch
15:15 DS 2.6 Gracing incidence FTIR of thin high-k dielectrics — •Wenke Weinreich, Johannes Müller, Martin Rose, Lutz Wilde, Martin Lemberger, Marco Steinert, and Uwe Schröder
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