Regensburg 2010 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
MM: Fachverband Metall- und Materialphysik
MM 26: Poster Session
MM 26.32: Poster
Dienstag, 23. März 2010, 14:45–16:30, Poster C
Mechanical Characterization of Layered Nanocomposites — •Inga Knorr, Susanne Seyffarth, Tobias Liese, Hans-Ulrich Krebs, and Cynthia A. Volkert — Institut für Materialphysik, Universität Göttingen
Multilayer thin films with dimensions at the nanometer scale represent a technologically important class of materials which can offer improved mechanical properties as a result of composite and size effects. The samples studied here consist of Cu/PMMA- and Ti/ZrO2-multilayer films produced using pulsed laser deposition. Mechanical characterization is performed in a nanoindenter using Berkovich indentation as well as micro-compression tests on columns machined from the films with a focused ion beam microscope. Furthermore, the morphology of the samples in the undeformed and deformed states is investigated with SEM and TEM. The goal of the studies presented here is to gain information about the size-dependence of the layer mechanical properties as well as to identify deformation and failure mechanisms in multilayered samples. Details about the mechanical properties of films with layer thicknesses between 5 and 1000nm will be presented. The dependence of mechanical behavior and deformation morphology on layer dimensions will be discussed.