O 82: Graphene IV
Freitag, 26. März 2010, 11:15–13:00, H31
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11:15 |
O 82.1 |
Spin-Splitting of Graphene/Au/SiC investigated with Spin- and Angle-Resolved Photoemission Spectroscopy — •Isabella Gierz, Fabian Meier, Bartosz Slomski, Jan Hugo Dil, Jürg Osterwalder, Christian R. Ast, and Klaus Kern
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11:30 |
O 82.2 |
High Resolution Electron Energy Loss Spectroscopy on Graphene/SiC(0001) — •Roland J. Koch, Michael Endlich, Thomas Haensel, Syed Imad-U. Ahmed, Thomas Seyller, and Juergen A. Schaefer
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11:45 |
O 82.3 |
AFM imaging of graphene under ambient conditions — •Michael Enzelberger, Viatcheslav Dremov, Florian Speck, Catharina Knieke, Angela Berger, Thomas Seyller, Wolfgang Peukert, and Paul Müller
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12:00 |
O 82.4 |
Low Temperature Epitaxial Graphene on SiC by Carbon Deposition — •Ameer Al-Temimy, Christian Riedl, and Ulrich Starke
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12:15 |
O 82.5 |
Quasi-freestanding Graphene on SiC(0001) — •Florian Speck, Markus Ostler, Jonas Röhrl, Johannes Jobst, Daniel Waldmann, Martin Hundhausen, Lothar Ley, Heiko B. Weber, and Thomas Seyller
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12:30 |
O 82.6 |
Crystal Symmetry and Stress in Epitaxial Graphene Films — •Diedrich Schmidt and Taisuke Ohta
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12:45 |
O 82.7 |
Plasmons in epitaxial graphene: influence of steps and doping concentration — •Thomas Langer, Herbert Pfnür, Christoph Tegenkamp, and Hans Werner Schumacher
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