Berlin 2012 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 20: Application of thin films
DS 20.2: Vortrag
Mittwoch, 28. März 2012, 09:45–10:00, H 0111
Single-Shot Imaging of Transient Reflectivity Changes for Temporal Jitter Characterization in Ultrafast X-ray Pump-Probe Experiments — M. Beye3, M. Bionta2, S. de Jong2, A. Galler1, C. Graves2, J. Gruenert1, M. Holmes2, O. Krupin1,2, •B. Li1, R. Marvel4, M. Minitti2, A. Reid2, and W. F. Schlotter2 — 1European XFEL GmbH, Hamburg, Germany — 2SLAC National Accelerator Laboratory, CA 94025, USA — 3Helmholtz Zentrum Berlin, Germany — 4Vanderbilt University, Nashville 37235, USA
The X-ray Free-Electron-Laser sources will enable frontier research in the studies of extremely small structures (angstrom resolution) and extremely fast phenomena (<10 fs) at the same time. The origin of a Self-Amplified Spontaneous Emission-based FEL is the shot noise in the electron bunch, and thus each individual FEL pulse is different in terms of pulse energy, spectrum, wavefront, temporal properties etc. Measuring the temporal profile of the ultrafast FEL pulse remains a very challenging topic [1-2]. Here we report on recent results from a research campaign at the LCLS SXR instrument, where single-shot images of the cross-correlation of XFEL pulses and infrared laser pulses are measured and analyzed. The X-ray induced transient change of optical reflectivity is observed and the time delay in-between the X-ray pulses and optical laser pulses could also be derived preliminarily.
[1] Nature Photonics, 2, 165 (2008). [2] J. Phys. B: At. Mol. Opt. Phys., 43, 194010 (2010).