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HL: Fachverband Halbleiterphysik

HL 78: Graphene: Preparation and characterization I (O, jointly with HL, TT)

HL 78.10: Vortrag

Donnerstag, 14. März 2013, 12:45–13:00, H17

Graphene on Rh(111) and Ru(0001): combined STM/NC-AFM and DFT studies — •Yuriy Dedkov¹, Torben Haenke¹, Oliver Schaff¹, Andreas Thissen¹, Elena Voloshina², and Mikhail Fonin³ — ¹SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany — ²Physikalische und Theoretische Chemie, Freie Universität Berlin, 14195 Berlin, Germany — ³Fachbereich Physik, Universität Konstanz, 78457 Konstanz, Germany

The electronic and crystallographic structure of graphene moiré on Rh(111) and Ru(0001) is studied via combination of density-functional theory calculations and scanning tunneling and noncontact atomic force microscopy (STM and NC-AFM). Whereas the principal contrast between hills and valleys observed in STM does not depend on the sign of applied bias voltage, the contrast in atomically resolved AFM images strongly depends on the frequency shift of the oscillating AFM tip. The obtained results demonstrate the perspectives of application atomic force microscopy/spectroscopy for the probing of the chemical contrast at the surface.