Regensburg 2013 – wissenschaftliches Programm
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HL: Fachverband Halbleiterphysik
HL 78: Graphene: Preparation and characterization I (O, jointly with HL, TT)
HL 78.10: Vortrag
Donnerstag, 14. März 2013, 12:45–13:00, H17
Graphene on Rh(111) and Ru(0001): combined STM/NC-AFM and DFT studies — •Yuriy Dedkov1, Torben Haenke1, Oliver Schaff1, Andreas Thissen1, Elena Voloshina2, and Mikhail Fonin3 — 1SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany — 2Physikalische und Theoretische Chemie, Freie Universität Berlin, 14195 Berlin, Germany — 3Fachbereich Physik, Universität Konstanz, 78457 Konstanz, Germany
The electronic and crystallographic structure of graphene moiré on Rh(111) and Ru(0001) is studied via combination of density-functional theory calculations and scanning tunneling and noncontact atomic force microscopy (STM and NC-AFM). Whereas the principal contrast between hills and valleys observed in STM does not depend on the sign of applied bias voltage, the contrast in atomically resolved AFM images strongly depends on the frequency shift of the oscillating AFM tip. The obtained results demonstrate the perspectives of application atomic force microscopy/spectroscopy for the probing of the chemical contrast at the surface.