MM 11: Topical Session: TEM-Symposium - STEM
Montag, 11. März 2013, 15:45–18:15, H4
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15:45 |
MM 11.1 |
Topical Talk:
Scanning transmission electron microscopy at atomic resolution — •Ferdinand Hofer, Gerald Kothleitner, and Werner Grogger
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16:15 |
MM 11.2 |
High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures — •Paul Voyles, Andrew Yankovich, Benjamin Berkels, Peter Binev, and Wolfgang Dahmen
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16:30 |
MM 11.3 |
Characterisation of ultrathin ferroelectric film using scannning transmission electron microscopy — •Daesung Park, Anja Herpers, Tobias Menke, Regina Dittmann, and Joachim Mayer
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16:45 |
MM 11.4 |
A transmission electron microscopy study on highly strained BiFeO3 thin films — •Young Heon Kim, Akash Bhatnagar, Ji Hye Lee, Marin Alexe, Eckhard Pippel, and Dietrich Hesse
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17:00 |
MM 11.5 |
Microscopic origin of the giant ferroelectric polarization in strained BiFeO3 thin films — •Marta D. Rossell
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17:15 |
MM 11.6 |
STEM HAADF characterization of dilute Bi containing GaAs — •Nikolai Knaub, Andreas Beyer, Peter Ludewig, and Kerstin Volz
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17:30 |
MM 11.7 |
Analytical transmission electron microscopy in the third dimension — •Bert Freitag, Arda Genc, Jonathan Winterstein, Huikai Cheng, Lee Pullan, and Joerg Jinschek
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17:45 |
MM 11.8 |
High-resolution HAADF-STEM analysis of hetero-interfaces — •Anna Moros, Harald Rösner, and Gerhard Wilde
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18:00 |
MM 11.9 |
Electrostatic Phase Plates for Transmission Electron Microscopy — •Simon Hettler, Manuel Dries, Nicole Frindt, Rasmus R. Schröder, and Dagmar Gerthsen
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