Dresden 2020 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 28: Microscopy and Spectroscopy with X-rays, Ions and Positrons (joint session KFM/CPP)

CPP 28.4: Vortrag

Montag, 16. März 2020, 16:00–16:20, TOE 317

Multiscale Mapping and Quantification of Elastic Stress and Domain Size in Bulk Ferroelastic Systems by Dark-Field X-Ray Microscopy — •Jan Schultheiß1,2, Lukas Porz1, Lalitha Kodumudi Venkataraman1, Marion Höfling1, Semen Gorfman3, Jürgen Rödel1, and Hugh Simons41Department of Materials and Earth Sciences, TU Darmstadt, Germany — 2Department of Materials Science and Engineering, NTNU Trondheim, Norway — 3Department of Materials Science and Engineering, Tel Aviv University, Israel — 4Department of Physics, DTU, Denmark

Twinned domains in ferroelastic systems are intimately coupled to local strain fields. Problematically, in complex oxides this coupling often spans over several orders of magnitude of length scale. State-of-the art characterization techniques, however, either lack spatial resolution or their sensitivity is limited to the surface.
Here we use Dark-field X-Ray Microscopy to map and quantify spatial variations of elastic stress and domain size from nm to several µm in a grain of a polycrystalline ferroelectric/ferroelastic (Ba,Ca)(Zr,Ti)O3 model system as a function of the applied electric field. We find, that the electric field narrows the distribution of elastic stresses by 60%, while the domain size increases by 35%. The suggested methodology can be applied to multiscale correlations in emerging fields in complex oxides and twinned systems.

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