Dresden 2020 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 93: Scanning Probe Techniques II: Method development (joint session O/CPP)
CPP 93.5: Talk
Thursday, March 19, 2020, 11:30–11:45, WIL C107
Electrostatic Force Separation in Electrochemical Strain Microscopy — •Sebastian Badur1, Diemo Renz2, Thomas Göddenhenrich1, Bernhard Roling2, and André Schirmeisen1 — 1Institute of Applied Physics, Justus-Liebig University Gießen, Germany — 2Philipps-University Marburg, Germany
In electrochemical strain microscopy an AC voltage is applied to a conductive SPM tip in contact to a mixed conductor. Detection of a few picometer of Vegard-strain allows characterization of electrochemical processes on the nanoscale. However, electrostatic contributions conceal the small displacements and thus are the major challenge to be overcome. Here, we present a novel compensation method, where the frequency dependence of Vegard-strain is utilized in a low and a high frequency regime in order to separate the electrostatic contribution and quantify electrochemical strain on mixed conducting Cu2Mo6S8 under ultra high vacuum conditions.