Dresden 2020 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 30: Poster I
HL 30.39: Poster
Tuesday, March 17, 2020, 13:30–15:45, P3
Deep level transient spectroscopy on thin rutile films — •Lukas Berg1, Laurin Schnorr1, Thomas Heinzel1, Carlos Cesar Bof Bufon2 und Leandro Merces2 — 1Heinrich Heine - Universität Düsseldorf — 2Brazilian Center for Research, Campinas
Time resolved electro-optical admittance measurements were performed on mono-crystalline Rutile thin films through an optically transparent rolled-up gold gate. Excitation pulses of different wavelengths in the infrared band were applied to the structure as a function of the temperature and the electric field and the admittance transients were recorded. The analysis of the time evolution reveals a binding energy of 0.6 eV for a single prominent defect level. Furthermore, a temperature and light intensity dependent delayed trap response was observed and investigated under various conditions.