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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 17: Microstructure, Real Structure and Crystal Defects

Freitag, 20. März 2020, 09:30–12:30, TOE 317

09:30 KFM 17.1 Emitter-Site Specificity of Hard X-ray Photoelectron Kikuchi-Diffraction — •Olena Fedchenko, Aimo Winkelmann, Sergey Chernov, Katerina Medjanik, Sergey Babenkov, Steinn Agustsson, Dmitry Vasilyev, Moritz Hoesch, Hans-Joachim Elmers, and Gerd Schönhense
09:50 KFM 17.2 The influence of trace element additions to Al-1.7 at.% Cu alloys: preservation of quenched-in vacancies and atomistic mechanisms supporting θ   ′ — •Torsten E.M. Staab, Frank Lotter, Uwe Mühle, Mohamed Elsayed, Danny Petschke, Thomas Schubert, Alaa M. Ibrahim, Reinhard Krause-Rehberg, and Bernd Kieback
10:10 KFM 17.3 Using atomic force microscopy to tune functionality at the nanoscale — •Donald M. Evans, Theodor S. Holstad, Aleksander B. Mosberg, Didrik R. Småbråten, Per E. Vullum, Anup L. Dadlani, Zewu Yan, Edith Bourret-Courchesne, Jan Torgersen, Antonius T. J. van Helvoort, Sverre M. Selbach, and Dennis Meier
10:30 KFM 17.4 Exploring electronic properties of topological insulators using nuclear magnetic resonance — •Robin Guehne and Jürgen Haase
  10:50 20 min. break
11:10 KFM 17.5 Hidden Diversity of Vacancy Orderings in Prussian Blue Analogues — •Arkadiy Simonov, Hanna B. Boström, and Andrew L. Goodwin
11:30 KFM 17.6 Structural defects in silicon observed in situ by X-ray diffraction imaging during heating and solidification — •Maike Becker, Gabrielle Regula, Serge W. Neves Dias, Hadjer Ouaddah, Guillaume Reinhart, and Nathalie Mangelinck-Noël
11:50 KFM 17.7 Examination of defects and lattice vibrations in rare and common polytypes of Silicon Carbide — •Maximilian von Roeder, Jurek Lange, Detlev Hofmann, Sangam Chatterjee, and Peter Klar
12:10 KFM 17.8 Investigation of the real structure by means of unconventional methods of the analytical electron microscopy — •Enrico Langer
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DPG-Physik > DPG-Verhandlungen > 2020 > Dresden