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O: Fachverband Oberflächenphysik
O 80: Poster Session - Graphene: Adsorption, Intercalation and Doping
O 80.4: Poster
Mittwoch, 18. März 2020, 18:15–20:00, P2/EG
Intercalation of silver between graphene and silicon carbide studied by PEEM and AFM — •Philipp Weinert1, 2, Richard Hönig1, 2, Ulf Berges1, 2, and Carsten Westphal1, 2 — 1TU Dortmund, Dortmund, Deutschland — 2DELTA, Dortmund, Deutschland
Due to its outstanding electronic and mechanical properties graphene is of particular interest for many applications, for example as a new material in transistor applications, or constructing microscale structures.
In this study the intercalation of silver between one layer of graphene, the so called buffer layer, and the silicon carbide substrate is investigated. Other studies have shown, that covalent bounds between the silicon carbide and the buffer layer are released by intercalation, which leads to quasi free standing graphene.
To achieve the intercalation, samples have been coated with thin silver-films of different thicknesses. Subsequently, the samples were annealed to initiate the intercalation. In different steps of the annealing process, photoemission electron microscopy (PEEM) has been carried out to investigate the work function of the surface. This investigation has proven that silver intercalated underneath the buffer layer during the annealing. Furthermore, atomic force microscopy (AFM) has been carried out to investigate the topography of the samples after the intercalation. This study has shown that a small part of the silver does not intercalate, but forms islands on the surface.