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Heidelberg 2022 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 95: Pixel Detectors 3

T 95.4: Vortrag

Donnerstag, 24. März 2022, 17:00–17:15, T-H26

KEK Total Ionizing Dose Measurement of PXD Modules and sensor effects at Belle IIAriane Frey, Benjamin Schwenker, Yannik Buch, and •Marike Schwickardi — II. Physikalisches Institut, Georg-August-Universität Göttingen

The Belle II experiment at the Japanese B-factory SuperKEKB has started data taking in early 2019 and the peak luminosity will be ramped up to 8·1035cm−2s−1, which is 40 times higher than the previous luminosity delivered to the Belle experiment. It was therefore equipped with a new DEpleted P-channel Field Effect Transistor (DEPFET) based silicon PiXel Detector (PXD) for vertex detection to cope with higher beam backgrounds.

The monitoring of radiation effects on the new PXD is important throughout operation, since sensor settings have to be adjusted to ensure efficient operation. To compare observed effects to preliminary studies an accurate measurement of the total ionizing dose (TID) is needed. One way of dose monitoring is the diamond control units, that measure the radiation conditions for the Belle II detector. The diamonds are placed at different angles and positions close to the beam pipe and continuously take data. However, the diamonds do not measure the dose that the PXD received during beam times correctly, therefore the approach was chosen to estimate the TID of the PXD, using its occupancy. The drawback of this is that the PXD only sends out data while it is powered. To compensate that, the dose rate deposited when PXD DAQ is disconnect is estimated by scaling the dose rate of nearby diamonds with the ratio of pxd dose to diamond dose.

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