DS 1: Thin Film Properties: Structure, Morphology and Composition (XRD, TEM, XPS, SIMS, RBS, AFM, ...) 1
Montag, 5. September 2022, 09:30–10:45, H14
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09:30 |
DS 1.1 |
Low-energy ion channeling in nanocubes — •Shiva Choupanian, Wolfhard Möller, Martin Seyring, and Carsten Ronning
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09:45 |
DS 1.2 |
The contribution has been withdrawn.
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10:00 |
DS 1.3 |
Faster and lower dose X-ray reflectivity measurements enabled by physics-informed modelling and artificial intelligence co-refinement — •David Marecek, Julian Oberreiter, Andrew Nelson, and Stefan Kowarik
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10:15 |
DS 1.4 |
Scattergram analysis and filtering of differential phase contrast STEM images — •Julius Bürger, Maja Groll, Thomas Riedl, and Jörg K. N. Lindner
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10:30 |
DS 1.5 |
Contrast modes in transmission experiments using broad and focussed keV ion beams — •Svenja Lohmann, Gregor Hlawacek, Radek Holeňák, Nico Klingner, Daniel Primetzhofer, and Eduardo Serralta
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