O 3: Methods: Scanning probe techniques I
Montag, 22. März 2010, 11:15–13:00, H32
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11:15 |
O 3.1 |
Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy — •Tobias Jungk, Florian Johann, Akos Hoffmann, and Elisabeth Soergel
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11:30 |
O 3.2 |
SubSurface AFM: towards nondestructive 3D microscopy — •Gerard J. Verbiest, Johannes Simon, and Marcel J. Rost
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11:45 |
O 3.3 |
Atomic-resolution force map measurements on single molecules — •Fabian Mohn, Leo Gross, Nikolaj Moll, Peter Liljeroth, and Gerhard Meyer
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12:00 |
O 3.4 |
Interaction of the STM/AFM tip with graphite and graphene surfaces - theoretical models — •Martin Ondráček, Vít Rozsíval, and Pavel Jelínek
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12:15 |
O 3.5 |
Searching for spin contrast on NiO with Ni tips — •Florian Pielmeier and Franz J. Giessibl
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12:30 |
O 3.6 |
Challenges in constructing spin-polarized scanning probe tips — •Thorsten Wutscher and Franz J. Giessibl
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12:45 |
O 3.7 |
Characterization of tips for spin-polarized scanning tunneling microscopy — Guillemin Rodary, •Sebastian Wedekind, Hirofumi Oka, Dirk Sander, and Jürgen Kirschner
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