HL 87: Goup IV elements and their compounds II
  Donnerstag, 14. März 2013, 15:45–17:30, H15
  
    
  
  
    
      
        
          
            
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          15:45 | 
          HL 87.1 | 
          
            
            
              
                Indirect to direct gap transition in strained and unstrained group-IV semiconductor alloys — Christian Eckhardt, •Kerstin Hummer, and Georg Kresse
              
            
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          16:00 | 
          HL 87.2 | 
          
            
            
              
                Defect states at c-Si/a-Si3NxHy interfaces — •Leif Eric Hintzsche, Gerald Jordan, Martijn Marsman, Machteld Lamers, Arthur Weeber, and Georg Kresse
              
            
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          16:15 | 
          HL 87.3 | 
          
            
            
              
                First stages of 4H-SiC crystal growth: ab initio study — •Elwira Wachowicz and Adam Kiejna
              
            
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          16:30 | 
          HL 87.4 | 
          
            
            
              
                Reactive Ion Etching of Nano- and Ultrananocrystalline Diamond Films for Fabrication of Nanopillars — Christo Petkov, Emil Petkov, Florian Schnabel, Wilhelm Kulisch, Johann Peter Reithmaier, and •Cyril Popov
              
            
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          16:45 | 
          HL 87.5 | 
          
            
            
              
                Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations — •Kolja Kolata, Niko S. Köster, Alexey Chernikov, Michael J. Drexler, Eleonora Gatti, Stefano Cecchi, Daniel Chrastina, Giovanni Isella, Mario Guzzi, and Sangam Chatterjee
              
            
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          17:00 | 
          HL 87.6 | 
          
            
            
              
                Photonic crystal microcavities for the luminescence enhancement of Si/Ge-Quantum dots around 1550nm wavelength — •Viktoriia Rutckaia, Benjamin Koehler, Vadim Talalaev, Frank Heyroth, and Joerg Schilling
              
            
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          17:15 | 
          HL 87.7 | 
          
            
            
              
                Side-wall damage analysis of low-k interlayer dielectric from energy-filtered transmission electron microscopy — •Pradeep K. Singh, Sven Zimmermann, Steffen Schulze, Stefan Schulz, and Michael Hietschold
              
            
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