 |
Mo, 10:15–11:30 |
H4 |
MI 1: Topical Session: Using Transmission Electron Microscopy to Unravel the Mysteries of Materials I - Joint Session with MM |
|
|
|
Mo, 11:45–13:15 |
H4 |
MI 2: Topical Session: Using Transmission Electron Microscopy to Unravel the Mysteries of Materials II - Joint Session with MM |
|
|
|
Mo, 14:00–14:45 |
H1 |
MI 3: Plenary Talk Pennycook (PV II) |
|
|
|
Mo, 15:15–17:00 |
H5 |
MI 4: Analytische Elektronenmikroskopie |
|
|
|
Di, 09:30–12:15 |
H5 |
MI 5: Quantitative Materialanalyse (mit KR) |
|
|
|
Mi, 09:30–10:45 |
H5 |
MI 6: X-ray Imaging, Holography and Tomography |
|
|
|
Mi, 11:00–12:15 |
H5 |
MI 7: Ion Beam Methods |
|
|
|
Mi, 12:30–13:30 |
H9 |
MI 8: Nanostructured Oxide Thermoelectrics - Joint Session with DF related to SYTS |
|
|
|
Mi, 15:00–17:00 |
Poster B2 |
MI 9: Poster: Microanalysis and Microscopy |
|
|
|
Do, 09:30–11:15 |
H5 |
MI 10: Scanning Probe Microscopy |
|
|