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09:30 |
DS 2.1 |
Probing the oxygen deficit in YBCO thin films with a positron beam — •Markus Reiner, Thomas Gigl, Rainer Jany, German Hammerl, and Christoph Hugenschmidt
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09:45 |
DS 2.2 |
Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis — •Philipp Hönicke, Matthias Müller, Blanka Detlefs, Claudia Fleischmann, and Burkhard Beckhoff
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10:00 |
DS 2.3 |
Model-based thin film characterization by confocal and total interference contrast microscopy — •Matthias Vaupel
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10:15 |
DS 2.4 |
Atom probe tomography study of the p-n junction in CIGS thin-film solar cells — •Anna Koprek, Oana Cojocaru-Mirédin, Christoph Freysoldt, Roland Wuerz, and Dierk Raabe
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10:30 |
DS 2.5 |
Crystallization of Ge nanoparticles in ZrO2-based dielectrics for electrical applications. — •David Lehninger, Larysa Khomenkova, Frank Schneider, Cameliu Himcinschi, Volker Klemm, David Rafaja, and Johannes Heitmann
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10:45 |
DS 2.6 |
First Synthesis Approach of Layered ZrSe2 and New Misfit Layer Compounds (PbSe)1+δ(ZrSe2)n Using Modulated Elemental Reactants — •Benjamin Eickmeier, Matti Alemayehu, Robert Zierold, Matthias Falmbigl, Sage Bauers, Johannes Gooth, Torben Dankwort, Julie Chouinard, Carmen Voigt, Carsten Ronning, David C Johnson, and Kornelius Nielsch
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11:00 |
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15 min. break.
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11:15 |
DS 2.7 |
Growth and Properties of Crystalline Silicon deposited on Glass by Steady-State Solution Growth — •Christian Ehlers, Roman Bansen, Jan Schmidtbauer, Franziska Ringleb, Thomas Teubner, and Torsten Boeck
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11:30 |
DS 2.8 |
Comparative Studies in the Physical and Optical Properties of Indium Tin Oxide Films by Various Fabrication Processes — •Akemi Tamanai and Annemarie Pucci
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11:45 |
DS 2.9 |
Microstructure and mechanical properties of Pd-Si amorphous thin films — •Sree Harsha Nandam, Di Wang, Ruth Schwaiger, Zbigniew Sniadecki, Yulia Ivanisenko, Herbert Gleiter, and Horst Hahn
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12:00 |
DS 2.10 |
Cu-poor/Cu-rich transition of co-evaporated CuInSe2: Na prevents annihilation of planar defects — •Helena Stange, Stephan Brunken, Humberto Rodriguez-Alvarez, Dieter Greiner, Christian Alexander Kaufmann, Anja Scheu, Jakob Lauche, Norbert Schäfer, Daniel Abou-Ras, and Roland Mainz
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12:15 |
DS 2.11 |
In situ X- Rays measurements of lattice expansion on metallic superlattices. — •Sotirios A. Droulias, Lennard Mooij, Gunnar K. Palsson, Xin Xiao, Vassilios Kapaklis, Bjorgvin Hjorvarson, and Max Wolff
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12:30 |
DS 2.12 |
GISAXS investigation of growth of Ag nanoparticles from atomic deposition: experiment and simulation — Celine Durniak, •Marina Ganeva, Gennady Pospelov, Walter Van Herck, and Joachim Wuttke
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12:45 |
DS 2.13 |
In-situ GIXD/GISAXS investigation of intercalation processes in bulk-heterojunction organic solar cells — •Marvin Berlinghof, Thaer Kassar, Nusret Sena Güldal, Christoph Brabec, and Tobias Unruh
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